Options Efficiently Test Next Generation Mass Storage Drive, Chipset, Datacom and Graphic Devices
SAN JOSE - NPTest, a wholly owned subsidiary of Schlumberger Limited (NYSE: SLB) formerly known as Schlumberger Semiconductor Solutions, introduced today a suite of advanced analog options that enable customers to test next generation, highly integrated SOC devices on the EXA3000 platform. The options particularly provide efficient testing of mass storage drives, chipset, datacom and graphics devices. The powerful upgrades support the industry's first test platform to combine the high bandwidth and fast data rate handling required for these devices with the throughput needed for production test, significantly improving production test quality.
New SOC designs continue to consolidate the functionality of separate chips onto a single device, increasing test complexity. With the integration of front-end hard disk drive read/write head interface onto a controller chip, there is a need to combine the implementation of complex PRML analog and high-speed functional tests on the same SOC test platform. The expanded EXA3000 analog options with the 4.8Gsps AWG (Arbitrary Waveform Generator) and 10GHz Bandwidth GigaBit Sampler for combined source and measure enhancements offer outstanding efficiency in PRML tests as well as the speed, resolution, bandwidth and throughput to succeed on the production floor.
"As the range of digital and analog functionality in SOCs expands, semiconductor companies need test platforms with the flexibility and scalability to meet varied and increasing performance standards," stated Doug Cutsforth, vice president, product marketing, NPTest. "With this suite of analog upgrades available for the EXA3000, we offer our customers unbeatable test capabilities at low cost for devices at the forefront of SOC performance."
The analog options support a high mix of test functionality for devices in mass storage drives, chip set, graphics and datacom applications. The 4.8 Gsps AWG option for PRML tests is flexibly configurable to provide a 1x differential channel @ 4.8Gsps, 2x channels @ 2.4Gsps, or 4x Channels @ 1.2Gsps. The upgrade enhances performance to 8 bits with 1.9GHz bandwidth. The Gigabit Sampler option extends sampling capability for hard disk drives, DVI (TMDS), USB2.0 and 3G/10G-SERDES tests to 10GHz bandwidth with 50Msps at 12-bit resolution. With an extremely low noise floor, the Gigabit Sampler has 40dB SNR for a 400MHz signal. These analog capabilities combine to provide outstanding source and measure functionality.
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About EXA3000
The EXA3000 semiconductor test system leads the industry in speed and accuracy, providing +/-50ps edge-placement accuracy, up to 3.2Gbps data rates, true differential pin electronics, an integrated source synchronous timing solutions, configuration flexibility and a -120dBc analog noise floor that results in the highest device output and yields on the most demanding devices. With full configuration flexibility on both digital and analog test resources, the EXA3000 system is designed to test a wide range of SOC, next generation digital bus interfaces - HyperTransport, InfiniBand, RapidIO, DDR and high-speed datacom devices. Its easy-to-configure architecture and over 100 mixed signal test options make it an ideal candidate for test houses and contract manufacturers.
About NPTest, Inc.
NPTest Inc. is a leading provider of advanced test and diagnostic systems and product-related engineering services to the semiconductor industry. NPTest customers include semiconductor manufacturers, fabless companies, foundries and assembly contractors worldwide. Additional information is available at www.nptest.com.
For further information, contact:
Mary Jo Colton
NPTest, Inc.
Tel: 408-586-6474
mcolton@nptest.com
© Press Release 2006
