New Platform Combines Technologies for the Highest Performance and Measurement Quality with Flexibility and Portability, Key Criteria for Validation of Complex ICs
SAN JOSE, CA - NPTest, a wholly owned subsidiary of Schlumberger Limited (NYSE:SLB) formerly known as Schlumberger Semiconductor Solutions, introduced today the IDS OptiCA, the semiconductor industry's first IC failure analysis and design debug system with a flexible hardware architecture that integrates static and dynamic analysis instruments on a single platform. By fully integrating emission-based transistor-timing measurement capability, photo-emission microscopes, and a thermal laser stimulation system, the NPTest IDS OptiCA offers unmatched performance and quality of measurements for the validation of advanced ICs, especially flip-chip packaged devices. The IDS OptiCA platform is a powerful environment to easily integrate and cross reference different failure analysis and debug measurements for increasingly complex device analysis problems.
The IDS OptiCA system's flexible platform combines the latest failure analysis methodology, TIVA/SEI (Thermally Induced Voltage Alteration and Seebeck Effect Imaging), and more conventional photo-emission microscopes such as CCD or MCT (Mercury Cadmium Telluride) with the high accuracy timing measurement capability based on transistor-switching using NPTest SSPD (Superconducting Single element Photon Detector) technology. The combination of multiple instruments on a single platform makes it easier to manage capacity for different measurements, maintain high equipment utilization and cost-effectively analyze device failures.
"Shrinking device geometry, increasing circuit density, decreasing defect size and new defect types are creating daunting challenges for failure analysis engineers," stated Michel Villemain, vice president and general manager, Probe Systems, NPTest. "Fortunately, in parallel development, material science advancements are making new types of detectors available to us. The unique architecture of the IDS OptiCA makes it possible to integrate new detector or measurement options as they become available. The platform's flexibility extends the life of the vital system in an environment that is rapidly evolving."
The NPTest IDS OptiCA architecture is based on a proven hardware system with over 15 years of experience in support of sub-micron in-circuit measurements in a typical test floor environment. Since today's device complexity results in failures that are not reproducible, with a simple device power supply, analysis often requires driving test vectors directly through the tester in the less controlled environment of the test floor. The IDS OptiCA system features direct tester docking and offers outstanding vibration isolation capability to provide unmatched measurement results - even on the test floor.
Configured for increasingly common flip-chip packaged devices, the standard IDS OptiCA configuration includes a Laser Scanning Microspoce (LSM) for through-silicon imaging from the backside. Interfaces to widely used CAD layout tools combine with the high resolution LSM imaging to allow easy and accurate navigation of fault locations within chips.
Currently the IDS OptiCA features these powerful options:
- TIVA/SEI/OBIRCH: Thermally Induced Voltage Alteration (TIVA) and Seebeck Effect Imaging (SEI) are rapidly becoming standard methods in localizing defects.
- CCD/MCT: The system offers the flexibility to integrate a backside illuminated CCD camera and/or an ultra-high sensitivity emission camera using Mercury Cadmium Telluride. Cryo-cooled MCT assembly offers optimal temperature control with lower dark count, eliminating the need to maintain liquid nitrogen.
- SSPD: Superconducting Single Element Photon Detector offers the capability to analyze transistor-switching timing and behavior from the backside. The NPTest proprietary detector material achieves high QE, allowing fast acquisition of high accuracy timing measurements of the most advanced transistors.
The IDS OptiCA is available and shipping today. It joins a long line of IDS series instruments developed by NPTest (formerly Schlumberger) enabling semiconductor manufacturers to measure and validate IC in-circuit performance. The series includes electron-beam tools, laser voltage probe and photo-emission instruments for in-circuit measurements and focused ion beam (FIB) tools for in-circuit modification.
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About NPTest
NPTest Inc. provides advanced test and diagnostic systems and product engineering services to the semiconductor industry. NPTest customers include semiconductor manufacturers, fabless companies, foundries and assembly contractors worldwide. Additional information is available at www.nptest.com.
For further information, contact:
Mary Jo Colton
NPTest, Inc.
Tel: 408-586-6474
mcolton@nptest.com
© Press Release 2006
